INTEGRATED CIRCUIT FABRICATION PROCESS IC TESTING RELIABILITY FAILURE ANALYSIS

ZAHIT, ROSFAZLISZAH; YAHYA, AZLIN; HASHIMUDDIN, MOHD FARIS

Please use this identifier to cite or link to this item: https://repositori.mypolycc.edu.my/jspui/handle/123456789/9044

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DC Field	Value	Language
dc.contributor.author	ZAHIT, ROSFAZLISZAH	-
dc.contributor.author	YAHYA, AZLIN	-
dc.contributor.author	HASHIMUDDIN, MOHD FARIS	-
dc.date.accessioned	2026-03-30T05:23:05Z	-
dc.date.available	2026-03-30T05:23:05Z	-
dc.date.issued	2025	-
dc.identifier.uri	https://repositori.mypolycc.edu.my/jspui/handle/123456789/9044	-
dc.description	Integrated circuits (ICs) are at the core of today’s technology — powering smartphones, computers, and industrial systems. Understanding how ICs are tested, evaluated, and maintained for reliability is a key foundation for future engineers and technologists. This eBook, “IC Testing, Reliability and Failure Analysis,” is part of the Integrated Circuit Fabrication Process learning series. It introduces students to essential post-fabrication concepts including IC testing, reliability prediction, degradation behavior, and failure analysis. To enhance understanding, this eBook integrates interactive learning elements such as videos for visual demonstration, quizzes for self- assessment, and illustrations to support conceptual clarity. These features aim to make learning more engaging, dynamic, and aligned with real-world semiconductor practices.	ms_IN
dc.language.iso	en	ms_IN
dc.publisher	POLITEKNIK MERLIMAU	ms_IN
dc.subject	Semiconductor Fabrication	ms_IN
dc.subject	Wafer Processing	ms_IN
dc.title	INTEGRATED CIRCUIT FABRICATION PROCESS IC TESTING RELIABILITY FAILURE ANALYSIS	ms_IN
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