Browsing by Author Nam, Choon-sung
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| Issue Date | Title | Author(s) |
|---|---|---|
| 2025-10-01 | ANALYSIS OF LATENT DEFECT DETECTION USING SIGMA DEVIATION COUNT LABELING (SDCL) | Koo, Yun-su; Shin, Woo-chang; Park, Ha-je; Yang, Hee-yeong; Nam, Choon-sung |